Probe for EPMA

Probe For EPMA is designed for maximum compatibility for interfacing simultaneously with your existing OEM EPMA instrument computer system.

Probe Software utilizes a sophisticated and advanced native TCP/IP implementation for all instrument communication, therefore no alteration to your current system is required. This means that both the OEM and Probe Software applications work together to improve your productivity and expand your analytical options.

• Allows both Probe Software and your OEM software to be connected simultaneously to your JEOL and Cameca instruments without re-configuration or re-connection.

• Now you can have the powerful Probe for EPMA algorithms running on your new or existing JEOL or Cameca instruments with just a simple network connection!

• Allows maximum flexibility for acquisition, automation and analysis of points and pixels.

• Probe for EPMA has an unlimited redistribution license for off-line data re-processing!

• Everyone who acquires data with your instrument can have a copy for off-line analysis of their data. Re-process your EPMA data in your office or on the road!

• All x-ray intensity data and operating conditions from each microprobe run are saved automatically (data for all utilized standards, unknowns, wavelength scans, digitized coordinates, images, etc.). All user specified parameters are automatically preserved for subsequent re-processing!

• Add or drop analyzed or specified (unanalyzed) elements at any time during the acquisition.

• Automatic saving of all peaking and PHA scans including instrument conditions and sample information.

• Software updates are always free and instantly downloadable.

Easily and automatically correct for spectral interferences for both WDS and EDS elements for up to 5 interfering elements per element. Perform trace element quantification with confidence!

Automatically correct for intensity changes over time for beam sensitive materials using our unique log-linear, quadratic and log-log TDI modeling. Never again limit your sensitivity or spatial resolution for beam sensitive materials!

Modern EPMA instruments equipped with large area analyzing crystals can now routinely achieve sensitivities for most elements in the 10 to 100 PPM levels. However, because of various sample and instrumental artifacts in the x-ray continuum, absolute accuracy is more often the limiting factor for trace element quantification.

Therefore, Probe Software provides a quantitative “blank” correction which can be automatically applied to x-ray intensities during the matrix iteration process to correct for these systematic errors.

Use multiple (up to 18 per side) off-peak positions to dynamically calculate the best possible background fit and avoid off-peak overlaps automatically while also compensating for curved backgrounds.

Mean atomic number background corrections provide a unique, fast, high precision method for background removal for WDS analyses without off-peak background acquisitions.

Improve acquisition speed for all elements while improving precision for trace elements in half the time!

Probe for EPMA integrates WDS with EDS spectrum acquisition from both JEOL and Bruker EDS detectors, providing fully integrated acquisition, quantitative analysis and statistics for all analyzed elements.

Probe for EPMA supports integration of cathodo-luminescence (CL) spectrum acquisition for manual or automated point analyses. This CL spectrum acquisition can be performed in parallel with WDS intensity and EDS spectrum acquisitions.

Our Site License Allows for unlimited software distribution for data re-processing and output and complete WDS and EDS simulation and quantification for classroom teaching without an instrument.

Every student, client, user or faculty member gets a free copy of our applications for complete and flexible data re-processing in their office or on the road!