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Probe For EPMA Feature List

The following is only a partial feature list. If you do not see a feature here, please contact us. Chances are it's already been implemented. Please access our Probe for EPMA discussion forum here.

 

Probe For EPMA Quantitative Analysis Package

  • Complete system for acquisition, analysis and automation WDS quantitative microanalysis on JEOL and Cameca microprobes, using the PC industry standard Microsoft Windows NT/2000/XP/Vista/Win7 (32 and 64 bit) OS. Compatibility with all your favorite office applications!

  • File format is the industry standard relational database format (Microsoft Access) for all data storage using robust transactional processing for complete data integrity.

  • Complete off-line analysis and processing using any Windows PC or Mac Windows emulation software such as Parallels. Realistic Demo Mode for fast training using the Probe For EPMA acquisition and analysis software.

  • On-line, context sensitive HyperText linked help Files (~ 500 pages) with search and bookmark and print capability, plus:

    • Technical Notes
    • Sample Tutorials
    • Frequently Asked Questions
  • Support for up to 72 elements, 19999 samples, with 500 analyses per sample for one million analyses per run.

  • Source code available (Non Disclosure Agreement required).

Advanced Features :

  • Automatic storage of all x-ray intensity data and operating conditions from each microprobe run into a single file (all data for all utilized standards, unknowns, wavelength scans, etc.). Add or drop analyzed or specified elements at any time during the acquisition.

  • Change acquisition setup or conditions at any time during the acquisition. Save and recall element setups to a searchable relational database. Reload any previous run setup into a new run. Define sample setups and recall automatically during automated acquisition.

  • Quantitative spectral interference correction for both major and trace element analysis. Complete unknown, wavescan and standard automation including : random point, traverse, rectangular griddin, irregular polygon gridding (with averaged or 3D Fit of Z axis positions).

  • Easy to use Excel spreadsheet linking for automatic importing of results. Automatic standard drift correction in real time using linear interpolation for standard, interference and MAN background intensities for long duration runs with up to 40 re-standardizations per run.

  • Automated iterated polynomial fit MAN (corrected for absorption of the continuum) or off-peak background corrections (linear interpolation, average or single side and exponential fits) or any combination of background corrections within a single sample.

  • Complete selection of CITZAF absorption, atomic #, etc. corrections. Heinrich, Henke and/or Empirical mass absorption coefficients. Compositional searching and matching from multiple standard composition databases. Import/Export raw K-ratios or count data.

  • Wavelength scan acquisition and zoomable graphical display with complete KLM line markers (including high order lines) with intensity corrected display. Manual, semi-automatic and fully automated spectrometer peaking with graphical display of progress and results. Built in spectrometer and counter reproducibility testing routines.

  • Easy to use graphical "stage snap" feature for quick stage travel. Automated initial and final user defined re-standardizations with automated unknowns. On-the-fly adjustment of standard, unknown and wavescan sample positions. Automatic filament shutdown/standby interface. Complete standard analyses (secondary standard comparisons) with flexible standard re-assignment feature.

  • Standard composition reference databases (NIST, Deere, Howie and Zussman, Dana's Ore). Calculate any combination of elemental, oxide, element by specification, difference, relative to stoichiometric oxygen or any element. Formula, atomic percent, mineral end-member calculations.

  • Plot weight percent, formulas, atomic percents, standard Deviations, x-ray counts, wavelength scans (angstroms or spectrometer position) , raw K-ratios and/or X, Y (and Z), or relative micron coordinates, elapsed time (and much more) to publication quality graphics for printing, print to disk or export to bitmaps (all points or averages only).

  • Export weight percent, formulas, atomic percents, standard deviations, x-ray counts, wavelength scans (angstroms or spectrometer position) , raw K-ratios and/or X, Y (and Z), or relative micron coordinates, elapsed time (and much more) to ASCII files for external use (all points or averages only).

  • Homogeneity, detection limit and analytical sensitivity calculations. Integrated Area-Peak-Factor (APF) correction for light element analysis. Quantitative graphical volatile element correction for any or all elements using both calibration reference or internally referenced "self" calibration.

  • Automatic output of contour, 3-D surface and 256 gray or color quantitative stage scan mapping data.

  • Precision based counting option for similar intensity statistics. Option for "Quick" standard analyses (analyzes only referenced elements or all elements on standards). Standard, unknown and wavescan position database with ASCII import/export of sample coordinates.

  • 3-D Coordinate transformation import for unknown, wavescan and standard digitized data from ASCII files (including off-line microscope stages).

  • On-line data reference tables include: spectrometer position, emission lines, absorption edges, fluorescent yields, NIST x-ray tables and mass absorption coefficients. Quantitative modal phase analysis based on standard compositions.

  • Customized "evaluate" feature for determination of best standard/correction combination. Graphical position digitizing for both stage and beam deflection automation. Multiple condition setups and automation.

  • Graphical background modeling with linear, average, high only, low only, exponential (user defined), slope and polynomial fit options. Full integration of WDS/EDS including storage of complete spectrum and detector and analysis parameters, post processing of EDS analyses, spectrum display and export.

  • X-ray and electron range modeling. Support for thin film and particle quantitative analysis (based on Armstrong code).

  • Calculate detection limits for given conditions or conditions for given detection limit. Statistics based acquisition and off-peak count-time optimization.

  • Multiple export and customized output formats. Automatic Excel linking and export. Multiple keV acquisition and analysis. Duplicate element acquisition and “aggregated” x-ray intensity analysis for extreme trace elements.

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