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Electron Microprobe Software

Probe Software is dedicated to offering the best software for acquisition, automation and analysis for modern Jeol and Cameca electron microprobes. Unlike OEM instrument companies we do not sell hardware, instead we specialize in producing state-of-the-art software and are solely committed to producing the best user interface possible for your Electron Probe Micro Analyser (EPMA). By listening to our extensive customer base we make that special effort to implement your specific requirements and unique features to enable the ease of use you expect for your professional work.

Compatible, Flexible and Powerful

Probe For Windows (for quantitative analysis) and Probe Image (for imaging) are both designed for maximum compatibility to interface SIMULTANEOUSLY with your existing Jeol 8900, 8200, 8500 and Cameca SX100 computer systems. Probe Software utilizes a sophisticated and advanced native TCP/IP implementation for all instrument communication, therefore no alteration to your current system is required. This means that both the OEM and Probe Software applications can work together to improve your productivity and expand your analytical options.

Industrial Strength, Research Quality Products

Probe Software application suites are designed for total data integrity and stability with robust coding techniques and Transactional Processing methods for data transfer used by financial institutions. Working with scientists at NIST, California Institute of Technology, NASA, the Smithsonian Institution, UC Berkeley and other major research laboratories, Probe Software, Inc. offers applications which implement the latest and most advanced algorithms and methods available to microscopy from the user perspective.

All software is tightly integrated and designed to maximize your laboratory productivity. All instrument configuration, x-ray intensity, imaging, peak scans, PHA scans, EDS spectrums and coordinate data within each probe run are automatically saved to a flexible relational database format using transactional processing for maximum data stability and easy portability for off-line processing. Designed by microanalysis experts for microanalysis experts, these products incorporate a large number of specialized tools to make even the most difficult analytical task easier and more accurate.

Quantitative Spectral Interferences (publication) Probe for Windows seamlessly incorporates the scientific standard for fully quantitative spectral interference corrections for wavelength dispersive (WDS) x-ray intensities down to trace levels even with high magnitude overlaps. Based on a full iterated matrix correction procedure, Probe for Windows can even handle pathological cases of cascade and self-interfering spectral interferences.

Automatic Mosaic Imaging (abstract, Scanning, 1997) Probe Image is designed from the bottom up to quantitatively handle both spatial coordinate and signal intensity dimensions. Since image resolution is independently defined from the image aspect ratio, the automated creation of large area mosaic images from image grids or randomly acquired areas is easily performed.

Volatile Element Calibrations Based on a fully iterated procedure, Probe for Windows can correct for both intensity loss and gain as a function of time and apply a matrix correction to the modified intensities automatically. All calibration parameters and values are saved for archival purposes and can be adjusted during data reprocessing.

Complete Image Automation Acquire any number of image sets based on any number of instrument conditions, with complete automation of spectrometer positions for on and off-peak images. Z axis stage control for maintaining x-ray focus over large areas is an integral part of Probe Image.

Mean Atomic Number Background Modeling (publication) Probe for Windows offers a unique background modeling technique which allows fast and accurate background corrections without off-peak measurements for both major and minor elements along with linear, averaged, exponential and polynomial fit off-peak backgrounds for maximum flexibility and efficiency.

Arbitrary Beam and Stage Scan Areas Using beam and stage scan instrument primitives, Probe Image's sophisticated software algorithms can automatically acquire analog signal and x-ray intensity maps over samples areas of any defined shape with any pixel resolution. No limits to your imaging!
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